CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)
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US$48.00
Price when purchased online
Free shipping
Free 30-day returns
Sold and shipped by logmaster.hu
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Product details
| Management number | 233377762 | Release Date | 2026/06/27 | List Price | US$48.00 | Model Number | 233377762 | ||
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Read more
| ISBN10 | 1402083629 |
|---|---|
| ISBN13 | 978-1402083624 |
| Edition | 2008th |
| Language | English |
| Publisher | Springer |
| Dimensions | 6.14 x 0.67 x 9.21 inches |
| Item Weight | 1 pounds |
| Print length | 212 pages |
| Part of series | Frontiers in Electronic Testing |
| Publication date | June 21, 2008 |
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